Every chip has bugs — the real question is how fast you can find and fix them. Bugged Out is the bite-sized podcast where we shine a light on the art (and science) of functional verification.
In just 10–15 minutes per episode, host Harry Foster, Chief Scientist, Verification, Siemens EDA, sits down with leading innovators, engineers, and researchers to talk about what’s shaping the future of verification — from AI-driven tools to design-for-test, coverage closure, reliability, and more. Expect candid conversations, practical insights, and a few “war stories” from the trenches of debug.
Whether you’re a verification engineer, a design lead, or simply curious about how we “get the bugs out” of the chips that power our world, Bugged Out delivers focused, informative conversations designed to fit your busy schedule.
Breaking the coverage bottleneck: Unifying verification for modern chips
Harry Foster talks with Vladislav Palfy, Director of Solutions Management at Siemens EDA, about why coverage closure has become one of the biggest bottlenecks in modern verification. Drawing on insights from his
white paper, Questa One Unified Coverage Solution: Transforming Verification Through Intelligence, Vladislav explains how traditional brute-force approaches to coverage are struggling to keep up with the complexity of today’s semiconductor designs. Learn how a unified, intelligent approach to coverage—combining planning, automation, and analytics—helps teams break through coverage plateaus, reduce regression effort, and achieve faster, more confident verification closure.
Key Discussion Points
Why coverage closure is so hard today: How increasing design complexity and fragmented workflows have turned the last 10% of coverage into a major project risk.
The coverage plateau problem: Why adding more tests often stops improving coverage—and how intelligent analysis helps teams target the real gaps.
Unified coverage explained: How integrating planning, analysis, and execution creates a more systematic and predictable path to verification completeness.
The role of the unified coverage database: How a centralized coverage architecture enables collaboration across teams, tools, and geographies.
From brute force to intelligent automation: How targeted test generation and coverage analytics dramatically reduce regression workloads.
Looking ahead: How AI-driven verification and predictive coverage planning could transform how engineers approach coverage closure in the next generation of chip design.
27 Jan 2026
SDC verification as a first-class asset: A deep dive with Chandu Challapalli
In this episode of Bugged Out, Harry Foster talks with Chandu Challapalli, Senior Management Director at Siemens EDA, about why timing constraints must be treated as first-class verification assets. Drawing on insights from his white paper, A Guide to SDC-Based Timing-Intent Verification with Questa One, Chandu explains how automated SDC verification uncovers hidden timing risks, balances under- and over-constraining, and shifts timing validation earlier in the design cycle. Learn how Questa One brings structure and automation to timing-intent verification—helping teams achieve faster signoff and greater confidence in first-pass silicon success.
Key Discussion Points
Why Timing Constraints Matter: How SDC files capture design intent—and why ignoring their verification invites silicon risk.
What Is Timing-Intent Verification?: A clear explanation of validating clocks, exceptions, and constraints against real design behavior.
Finding the Right Balance: The hidden costs of under-constraining versus over-constraining timing.
Common SDC Pitfalls: Missing clocks, invalid exceptions, and legacy constraints that mask real bugs.
Shifting Left on Timing: Why verifying constraints early—alongside RTL—reduces late-stage surprises.
What’s Next: A glimpse into continuous, AI-assisted timing-intent verification and tighter frontend/backend alignment.
16 Dec 2025
FutureCast 2026 — Part 2: Specialization, power, and intelligent verification
In Part 2 of the special FutureCast 2026 holiday series, Harry Foster continues exploring how the semiconductor landscape is rapidly changing — and why the next phase of innovation will be shaped as much by constraints as by breakthroughs.
This episode examines the forces pushing systems toward specialization, the growing challenge of data movement, and the rising impact of power, security, and runtime behavior on system correctness. Harry also discusses how verification teams can scale as complexity expands and why agentic AI will become essential to automation and workflow orchestration.
Key Discussion Points:
Why specialization becomes unavoidable as AI, robotics, and domain-specific compute accelerate
The growing impact of data movement bottlenecks and memory-centric architectures
How HBM, near-memory compute, analog accelerators, and photonics break legacy abstractions
Why physical effects such as thermals and statistical variation now influence functional correctness
How verification evolves across cross-domain workflows without overwhelming engineering teams
The role of hybrid digital twins in unifying logic, performance, physical behavior, and verification intent
Why power ceilings, security boundaries, and model drift become architectural concerns
How runtime safety, isolation, and lifecycle monitoring reshape verification planning
Why agentic AI shifts from tool enhancement to workflow orchestration and continuous validation
Predictions for 2026: AI-assisted verification becomes standard, and data movement emerges as a verification challenge
Predictions for 2030: thermal- and statistical-aware verification become standard practice, and agentic AI drives verification infrastructure while curated chiplet marketplaces begin to form
9 Dec 2025
FutureCast 2026 — Part 1: When silicon becomes a living system
Join host Harry Foster for a special holiday edition of Bugged Out. In this first episode of the two-part FutureCast 2026 series, Harry steps away from the usual guest interviews to look at how the semiconductor industry is evolving — and why innovation is now happening far above the transistor.
This episode explores why modern silicon behaves less like a static product and more like a living, continuously changing system. Harry highlights the technologies driving this shift, from multi-die architectures to software-defined hardware, and explains how verification must expand across the entire product lifecycle.
Key discussion points:
Why innovation has moved above the transistor
How chiplets, hybrid bonding, and HBM are redefining system
performance
The collapse of traditional design boundaries across logic,
timing, thermals, and software
Emerging system-level behaviors in multi-die architectures
Why these changes reshape verification across physical and logical domains
The role of hybrid digital twins in capturing system truth
How software-defined products evolve after shipping
Why OTA updates become verification events
The shift from traditional to lifecycle-aware verification
Predictions for 2026: multi-die verification becomes essential, and lifecycle-aware verification becomes mandatory for advanced AI-driven devices
Predictions for 2030: hybrid digital twins become foundational, and early chiplet vendors enter the market with curated offerings
25 Nov 2025
Better Stimulus Generation Through AI: Shaping the Future of Functional Verification
Episode Title: Better Stimulus Generation Through AI: Shaping the Future of Functional Verification
Host: Harry Foster
Guest: Tom Fitzpatrick, Industry Expert and Major Contributor to the Verification Academy
Episode Summary
Join host Harry Foster on Bugged Out as he welcomes industry veteran Tom Fitzpatrick to explore the transformative power of AI in functional verification. In this episode, Tom, author of the whitepaper "Better Stimulus Generation Through AI," delves into how Questa One Portable Stimulus Assist is revolutionizing stimulus generation. He compares traditional UVM approaches with the Portable Test and Stimulus Standard (PSS), discusses the evolving skill sets for engineers in an AI-driven world, and shares his vision for the future of verification. Tune in to understand why PSS is set to become the next major leap in productivity and abstraction for chip verification!
Key Discussion Points:
The Mission of Bugged Out: Harry introduces the podcast's goal: to bring candid conversations about finding and fixing bugs in complex chips.
Meet the Expert: Jake Wiltgen, an expert in safety-critical systems, functional safety standards, and DFT, shares his extensive industry experience.
What is DFT? Jake breaks down Design for Test in an accessible way, explaining its primary objective: to deliver high-quality, functionally correct silicon by building in capabilities to test for manufacturing defects.
Jake's Journey into DFT: Discover how Jake got pulled into the world of DFT, driven by growing needs for fault-grading and addressing long-running serial simulations.
Tackling the Tapeout Bottleneck: Learn why DFT sign-off often becomes a bottleneck during the critical period between netlist drop and tapeout, and how Questa One helps accelerate these essential simulations.
Mega-Trends in DFT: Harry and Jake discuss the impact of technology scaling, design scaling, and system scaling on engineers, noting that the growing volume of DFT verification at both block and top levels is a major challenge.
Evolving Challenges: Reliability and Aging Silicon: Explore how the objectives of DFT remain the same, but the methods have evolved dramatically due to embedded AI, autonomous vehicles, and angstrom-scale technology nodes.
In-System Test (IST) in Practice: Jake paints a vivid picture of IST, illustrating its benefits in data centers (predicting silicon failure) and automotive (detecting safety-critical system failures before they cause harm).
Resources Mentioned:
White Paper: "Better Stimulus Generation Through AI" by Tom Fitzpatrick.
25 Nov 2025
Accelerating DFT Sign-off: Getting the Bugs Out of Complex Chips
Episode Title: Accelerating DFT Sign-off: Getting the Bugs Out of Complex Chips
Host: Harry Foster
Guest: Jake Wiltgen, Director of IC Verification Solutions at Siemens EDA
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Episode Summary
Join host Harry Foster on Bugged Out as he dives deep into the world of functional verification with special guest Jake Wiltgen from Siemens EDA.
This episode explores the critical role of Design for Test (DFT) in ensuring high-quality silicon for today's most complex chips. Jake shares his journey into DFT, explains why it's more crucial than ever, and highlights key insights from his whitepaper, "Accelerating DFT sign-off with Questa One."
Discover how new verification technologies are tackling bottlenecks, addressing mega-trends in chip design, and evolving to meet the challenges of silicon reliability and in-system test.
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Key Discussion Points
The Mission of Bugged Out: Harry introduces the podcast's goal: to bring candid conversations about finding and fixing bugs in complex chips.
Meet the Expert: Jake Wiltgen, an expert in safety-critical systems, functional safety standards, and DFT, shares his extensive industry experience.
What is DFT? Jake breaks down Design for Test in an accessible way, explaining its primary objective: to deliver high-quality, functionally correct silicon by building in capabilities to test for manufacturing defects.
Jake's Journey into DFT: Discover how Jake got pulled into the world of DFT, driven by growing needs for fault-grading and addressing long-running serial simulations.
Tackling the Tapeout Bottleneck: Learn why DFT sign-off often becomes a bottleneck during the critical period between netlist drop and tapeout, and how Questa One helps accelerate these essential simulations.
Mega-Trends in DFT: Harry and Jake discuss the impact of technology scaling, design scaling, and system scaling on engineers, noting that the growing volume of DFT verification at both block and top levels is a major challenge.
Evolving Challenges: Reliability and Aging Silicon: Explore how the objectives of DFT remain the same, but the methods have evolved dramatically due to embedded AI, autonomous vehicles, and angstrom-scale technology nodes.
In-System Test (IST) in Practice: Jake paints a vivid picture of IST, illustrating its benefits in data centers (predicting silicon failure) and automotive (detecting safety-critical system failures before they cause harm).
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Resources Mentioned
White Paper: "Accelerating DFT sign-off with Questa One" by Jake Wiltgen.
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